X-Ray Topography

X-ray topography (XRT) is a nondestructive characterization technique for
imaging, by means of X-ray diffraction, the micrometer-sized to centimeter-
sized defect microstructure of crystals. Topography got its name from the
fact that the diffraction image can resemble a geographical topographic map
with the appearance of different elevations and topographical contours.
However, since diffracted X-rays form the image, its interpretation is not
always straightforward. XRT is a very powerful tool for the evaluation of
crystals for technological applications and for characterizing crystal and
thin-film growth and processing. The aim of this guide is to make modern
X-ray topography more accessible to materials scientists and others who
would benefit from the rich variety of microstructural information that it offers.
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